It is now possible to measure 500 µm thick alumina using a split cylinder. With conventional software, it was necessary to process the sample to 100 µm or less, but by using newly developed software (special option), it is possible to handle thick samples. This is extremely effective for evaluating materials such as ceramics that have a relatively high dielectric constant and ultra-low loss, and are difficult to process into thin forms. Materials with low dielectric constants such as PTFE can also be measured even if they are 1 mm thick.