Microwave/mmWave Material Measurement
Microwave/mmWave Material Measurement
The NIST chose our Split Cylinder Resonator (SCR) as the test method for the mmWave Permittivity Reference Material Development Project.
See the product page for details.
Our Solutions catalog provides real-world examples of how our product has helped other businesses achieve their goals. We hope these examples will help you see how our product can be a solution for you.
5G/6G/High Speed Digital/In-vehicle Radar... We now offer a broadband model that covers many critical applications in a single unit. Dielectric constant frequency characteristics of low-loss materials can be evaluated at once. Of course, easy and accurate measurement is the same as the banded models. It is an excellent companion for Keysight PNA N5290A/91A millimeter wave test systems.
In microwave material measurement, it is essential to select a right measurement method according to measurement objectives.
Read more
Ideal for evaluating low loss dielectric materials with tan δ 0.01 or less.
Easy operation: simply inserting a rod-shaped sample
Efficient and reliable measurement with our software
Robust hardware provides reproducible measurements over the years
Ideal for evaluating low loss dielectric materials with tan δ 0.01 or less
Easy and reproducible dielectric material measurement in millimeter wave band
Unique excitation mechanism of the upper limit frequency to 80 GHz
Test over wide freq
Ideal for evaluation of low-loss dielectric materials with tan δ < 0.01
Automatic measurement, 5 minutes to obtain the freq characteristics
Easy installation: Normal laboratory environment is sufficient
No need for anechoic chambers or absorbers
Easy to move and install lightweight design
1 μm precision antenna positioner, enabling accurate measurement
Easy operation and repeatable results
Low introducing cost
Read more
1-4-13 Mizukasadori, Nagata, Kobe, Hyogo
653-0842 Japan
Tel: +81-50-5370-0262
mail:
mido@emlabs.jp